| name | tof-sims-analyzer |
| description | Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging |
| allowed-tools | ["Read","Write","Glob","Grep","Bash"] |
| metadata | {"specialization":"nanotechnology","domain":"science","category":"surface-analysis","priority":"medium","phase":6,"tools-libraries":["ION-TOF software","SurfaceLab","NESAC/BIO tools"]} |
| graph | {"domains":["domain:nanotechnology"],"skillAreas":["skill-area:mathematical-reasoning","skill-area:physics-simulation","skill-area:data-analysis"],"workflows":["workflow:experiment-design"],"roles":["role:research-engineer"]} |
ToF-SIMS Analyzer
Purpose
The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.
Capabilities
- Molecular ion identification
- Surface contamination analysis
- 2D and 3D chemical imaging
- Isotope labeling detection
- Depth profiling
- Principal component analysis of spectra
Usage Guidelines
ToF-SIMS Analysis
-
Spectral Analysis