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nanodevice-flakedetect-align

Stars28
Forks6
UpdatedJune 6, 2026 at 23:39

Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.

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