semiconductor-test-overlay

name	semiconductor-test-overlay
description	Domain overlay for semiconductor test engineering. Extends language standards with test program, instrument communication, and data collection rules.

Semiconductor Test Overlay

Activates when sdlc-config.md sets domain.primary: semiconductor-test or domain.secondary includes it.

Additional ERROR Rules

• All instrument communication (GPIB/SCPI/serial) must have timeout protection
• Test measurements must log raw values before limit comparison
• Test limits must come from configuration (spec file/database) — never hardcoded in test code
• All test results must be traceable: DUT ID, timestamp, station ID, operator, program version
• Abort handlers must leave instruments in safe state (outputs disabled, relays open)
• Measurement units must be explicitly documented in variable names or comments

Additional WARNING Rules

• Separate test flow logic from instrument driver code (layered architecture)
• Use enums for test status: PASS, FAIL, ABORT, SKIP, NOT_TESTED
• Implement retry logic with configurable count for transient failures
• Log instrument errors (query SYST:ERR? after commands)
• Use correlation IDs to link test results across multiple test insertions
• Document measurement uncertainty and guard-banding strategy

Additional RECOMMENDATION Rules

• Use statistical process control (SPC) patterns for monitoring test health
• Implement Cpk calculation utilities for manufacturing readiness
• Use parallel test patterns where hardware supports it — document resource contention
• Cache calibration data with expiry — don't re-calibrate every DUT
• Use data compression for high-volume waveform capture storage

Test Program Structure

TestProgram/
├── Config/           # Limits, flow definitions, station config
├── Drivers/          # Instrument abstraction layer
├── TestModules/      # Individual test implementations
├── DataLog/          # Result logging and formatting
├── Utilities/        # Shared helpers (math, string, file I/O)
└── Main/             # Flow control and sequencing

Instrument Communication Pattern

1. Send command → 2. Wait for OPC (*OPC?) → 3. Query result → 4. Check SYST:ERR → 5. Parse and validate