semiconductor-test-program-review

name	semiconductor-test-program-review
description	Review semiconductor test program logic, limits, binning, datalog output, multisite behavior, correlation hooks, and production readiness. Use for ATE program changes, release reviews, and debug of suspicious yield shifts.

Semiconductor Test Program Review

Purpose

Review ATE test program behavior for correctness, maintainability, and production risk before release.

Review Checklist

• Test flow ordering and dependencies.
• Limit source, units, guardbands, and version control.
• Bin mapping and retest behavior.
• Datalog completeness and field naming.
• Multisite behavior and shared resource conflicts.
• Calibration, compensation, and correlation logic.
• Pattern/vector revision control.
• Skip conditions and engineering-only flags.
• Test time and timeout behavior.
• Error handling and fail-safe behavior.

Workflow

1. Identify changed files, changed tests, changed limits, and changed binning.
2. Check whether changes affect production disposition.
3. Look for site-specific behavior and uninitialized state.
4. Verify datalog compatibility with yield/SPC pipelines.
5. Produce release risk notes and required validation runs.

Output

Return findings ordered by severity:

• Blocking issues.
• Production risk issues.
• Maintainability issues.
• Missing validation.
• Suggested validation matrix.

Boundaries

Do not approve release without user-provided validation evidence.