| name | surface-analysis |
| description | Skill for surface composition, chemical state, and topography analysis including XPS depth profiling, AFM imaging, and contact angle measurements |
| allowed-tools | ["Read","Write","Glob","Grep","Bash"] |
| metadata | {"specialization":"materials-science","domain":"science","category":"materials-characterization","priority":"high","phase":6,"tools-libraries":["CasaXPS","Gwyddion","AFM analysis software","ImageJ"]} |
| graph | {"domains":["domain:materials-science"],"skillAreas":["skill-area:data-analysis","skill-area:statistical-analysis","skill-area:mathematical-reasoning"],"workflows":["workflow:experiment-design"],"roles":["role:research-engineer"]} |
Surface Analysis Skill
Purpose
The Surface Analysis skill provides comprehensive capabilities for characterizing material surfaces, enabling detailed analysis of surface composition, chemical bonding states, topography, and interfacial properties critical for understanding surface-sensitive phenomena.
Capabilities
- XPS depth profiling and chemical state analysis
- AFM imaging and roughness quantification
- Contact angle measurement and surface energy calculation
- Profilometry data analysis
- Surface contamination identification
- Tribological surface analysis