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Sonder4
GitHub 创作者资料

Sonder4

按仓库查看 2 个 GitHub 仓库中的 27 个已收集 skills。

已收集 skills
27
仓库
2
更新
2026-05-01
仓库浏览

仓库与代表性 skills

bfd-data-acquisition
软件开发工程师

Use when acquiring STM32 runtime data from global symbols, memory regions, stack-published local slots, or RTT channels and converting captures into structured artifacts for analysis.

2026-05-01
bfd-debug-interface
电子工程师(非计算机)

Use when debugging STM32 applications with J-Link or ST-Link, including breakpoints, watchpoints, register or memory inspection, HardFault analysis, and automated fault-context capture.

2026-05-01
bfd-flash-programmer
软件开发工程师

Use when flashing STM32 firmware, verifying flash results, diagnosing download failures, or running repeatable CLI-based flash workflows.

2026-05-01
bfd-matlab-mcd
软件开发工程师

Use when building a closed STM32-to-Matlab workflow for J-Link HSS data capture, system identification, PID/LQR/MPC tuning, Kalman parameter estimation, or Matlab/Simulink code-generation feedback loops.

2026-05-01
bfd-ozone
软件开发工程师

Use when preparing, auditing, repairing, or launching SEGGER Ozone STM32 debug projects (.jdebug / .jdebug.user). Trigger this skill when Ozone shows stale Windows paths, wrong ELF/SVD/device/interface settings, missing FreeRTOS awareness, duplicated case-variant project files, stale fixed J-Link serial bindings, or when a user wants a ready-to-debug Ozone session opened from the current STM32 project.

2026-05-01
bfd-rtt-logger
软件开发工程师

Use when capturing STM32 RTT output through the current J-Link mainline, validating runtime behavior after flash/reset, or collecting short runtime evidence from J-Link RTT channels.

2026-05-01
bfd-data-acquisition
软件开发工程师

Use when acquiring STM32 runtime data from global symbols, memory regions, stack-published local slots, or RTT channels and converting captures into structured artifacts for analysis.

2026-05-01
bfd-debug-interface
软件开发工程师

Use when debugging STM32 applications with J-Link or ST-Link, including breakpoints, watchpoints, register or memory inspection, HardFault analysis, and automated fault-context capture.

2026-05-01
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