| Broad resistive "transition" | Filamentary SC, bad contacts, current heating | AC χ or mutual inductance; lower current; remake contacts |
| ρ → 0 but no diamagnetism | Filaments, shunts, wrong geometry for χ | Meissner on same sample; trapped-flux or NV mapping |
| χ diamagnetic, ρ finite | Surface SC, shielding geometry, wrong demagnetization factor | Multiple geometries; penetrate with field > Hc1 locally |
| Tc shifts between cooldowns | Oxygen loss (cuprates), hydration, pressure drift | Document atmosphere; ruby pressure before/after |
| Hc2 anomalously low | Paramagnetic limiting, spin-flop, misaligned field | Align to crystallographic axes; check M(T) background |
| STM gap but no bulk Tc | Surface reconstruction, tip-induced superconductivity | Compare bulk transport; multiple surface preparations |
| Pressure run: sharp R drop, no Meissner | Non-SC metallic transition, partial sample SC | NV magnetometry; trapped-flux method; isotope effect; multiple DAC loads |
| Resistive jumps in I–V (films) | Channel/filamentary vortex flow | Map spatially; compare to Bean-model homogeneous flow |
| Sudden quench during field ramp | Flux avalanche, thermomagnetic breakdown | Lower ramp rate; thinner films; statistics of H_th |
| ΔC/(γTc) ≪ 1.43 with sharp ρ=0 | Nodal gap, multigap, or non-bulk SC | C(T) power law; ARPES nodes; χ bulk fraction |
| SdH frequency vs ARPES mismatch | Inhomogeneity, multiple phases, wrong band | Same crystal; align field axis; compare dHvA and SdH |
| REBCO Ic below manufacturer spec | Defect, delamination, warm spot, wrong θ | Scan Ic along length; check B and T calibration |
| Quench voltage missed | Slow NZP in HTS, short detection window | FBG/SQD wires; lower operating margin; FEM hotspot model |
| EPW Tc >> experiment | Wrong μ*, coarse k/q grids, unstable phonons | Converge grids; tune μ* only with justification; compare Allen–Dynes |
| Two-gap fit unstable | Multiband + anisotropy + disorder | Use direction-resolved PCS; Leggett mode in Raman |