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ebl-process-controller

Electron Beam Lithography skill for high-resolution nanopatterning with dose optimization and proximity effect correction

ソース情報

リポジトリ
a5c-ai/babysitter
ソースの最終更新活動
2026年6月1日 07:46
検出された SKILL.md の言語
英語
スター
1,813
フォーク
111

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SKILL.md
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name
ebl-process-controller
description
Electron Beam Lithography skill for high-resolution nanopatterning with dose optimization and proximity effect correction
allowed-tools
["Read","Write","Glob","Grep","Bash"]
metadata
{"specialization":"nanotechnology","domain":"science","category":"fabrication","priority":"high","phase":6,"tools-libraries":["BEAMER","GenISys TRACER","Raith NanoSuite"]}
graph
{"domains":["domain:nanotechnology"],"skillAreas":["skill-area:mathematical-reasoning","skill-area:physics-simulation","skill-area:data-analysis"],"workflows":["workflow:experiment-design"],"roles":["role:research-engineer"]}
# EBL Process Controller ## Purpose The EBL Process Controller skill provides comprehensive electron beam lithography process control, enabling high-resolution nanopatterning through dose optimization, proximity effect correction, and critical dimension control. ## Capabilities - Pattern design and fracturing - Dose optimization and modulation - Proximity effect correction (PEC) - Alignment and overlay control - Resist processing optimization - Critical dimension (CD) control ## Usage Guidelines ### EBL Process Control 1. **Pattern Preparation** - Design in CAD software - Fracture into write fields - Apply beam step size 2. **Dose Optimization** - Run dose matrices - Apply PEC algorithms - Account for pattern density 3. **Process Integration** - Optimize resist thickness - Control development conditions - Verify feature dimensions ## Process Integration - Nanolithography Process Development - Nanodevice Integration Process Flow ## Input Schema ```json { "pattern_file": "string", "resist": "string", "thickness": "number (nm)", "target_cd": "number (nm)", "beam_voltage": "number (kV)", "beam_current": "number (pA)" } ``` ## Output Schema ```json { "optimized_dose": "number (uC/cm2)", "pec_parameters": { "alpha": "number", "beta": "number", "eta": "number" }, "write_time": "number (hours)", "expected_cd": "number (nm)", "cd_uniformity": "number (3sigma)" } ```
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